The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Feb. 22, 2016
Applicant:

The Research Foundation for the State University of New York, Binghamton, NY (US);

Inventors:

Zhen Guo, Warrington, PA (US);

Mark Zhang, Vestal, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01); G06N 99/00 (2010.01); G06Q 10/10 (2012.01); G06N 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 17/30011 (2013.01); G06F 17/3053 (2013.01); G06F 17/30525 (2013.01); G06F 17/30882 (2013.01); G06N 7/005 (2013.01); G06Q 10/10 (2013.01);
Abstract

In a corpus of scientific articles such as a digital library, documents are connected by citations and one document plays two different roles in the corpus: document itself and a citation of other documents. A Bernoulli Process Topic (BPT) model is provided which models the corpus at two levels: document level and citation level. In the BPT model, each document has two different representations in the latent topic space associated with its roles. Moreover, the multi-level hierarchical structure of the citation network is captured by a generative process involving a Bernoulli process. The distribution parameters of the BPT model are estimated by a variational approximation approach.


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