The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Jun. 16, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Daniel Kalman, Tel-Aviv, IL;

Ory Segal, Tel-Aviv, IL;

Omer Tripp, Bronx, NY (US);

Omri Weisman, Tel-Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/57 (2013.01); G06F 21/10 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/10 (2013.01); H04L 63/1433 (2013.01); G06F 2221/034 (2013.01);
Abstract

Performing security analysis on a computer program under test (CPUT). The CPUT can be analyzed to identify data pertinent to potential security vulnerabilities of the CPUT. At least a first unit test configured to test a particular unit of program code within the CPUT can be automatically synthesized. The first unit test can be configured to initialize at least one parameter used by the particular unit of program code within the CPUT, and can be provided at least a first test payload configured to exploit at least one potential security vulnerability of the CPUT. The first unit test can be dynamically processed to communicate the first test payload to the particular unit of program code within the CPUT. Whether the first test payload exploits an actual security vulnerability of the CPUT can be determined, and a security analysis report can be output.


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