The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Sep. 14, 2012
Masashi Tsuchida, Tokyo, JP;
Takashi Kotera, Tokyo, JP;
Shohei Matsuura, Tokyo, JP;
Yukio Nakano, Tokyo, JP;
Masashi Tsuchida, Tokyo, JP;
Takashi Kotera, Tokyo, JP;
Shohei Matsuura, Tokyo, JP;
Yukio Nakano, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A data analysis method for analyzing data on a data analysis apparatus having: setting, a plurality of dimension tables each having a first identifier for identifying data to be analyzed and attributes corresponding to the first identifier; setting, a history table having a second identifier associated with each of the first identifiers of the dimension tables, and having attributes corresponding to the second identifier; setting, a relation table for storing attributes relating to the first identifier, the dimension tables having a first dimension table associated with the relation table through the attribute relating to the first identifier; associating, the first identifiers that refers to the first identifier of a first dimension table with the attributes; and processing, a query for the relation table and the first dimension table, and generating a second dimension table.