The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Jul. 15, 2014
Hitachi, Ltd., Tokyo, JP;
Kaushik Triyambaka Mysur, Singapore, SG;
Hirokazu Ikeda, Singapore, SG;
Hitachi, Ltd., Tokyo, JP;
Abstract
An application-aware, automated and proactive approach to event-based data analysis and management of data is disclosed. Events are operations directed at stored file content as specified by applications. The tracking of the events allows for the file types of the file content associated with the events to be determined for individual applications as event patterns which are managed as templates. For a set of events that match one of the templates, the appropriate timing to perform data management can be determined according to the event pattern and file types thereof as specified by the template. Further, plural templates can be correlated to define a workflow of plural applications by the event patterns thereof. Workflows are used to predict whether all applications have completed accessing the files associated therewith. Data management can then be executed on the files of the completed workflow.