The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Sep. 29, 2014
Emc Corporation, Hopkinton, MA (US);
Charles Hickey, Aptos, CA (US);
Mark Chamness, Menlo Park, CA (US);
Orit Levin-Michael, Irvine, CA (US);
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Exemplary methods for determining performance degradation of one or more disks at a storage system include analyzing disk performance statistics of a target storage system periodically collected during a storage of data from a source storage system to the target storage system, wherein the target storage system is a redundant array of inexpensive disks (RAID) storage system comprising of one or more arrays, each array comprising of a plurality of disks. The methods further include creating a predictive model based on the analysis of the collected performance statistics, and predicting, using the predictive model, that one or more disks of an array of the one or more arrays of the RAID storage system has degraded in performance.