The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Feb. 09, 2015
Oracle International Corporation, Redwood Shores, CA (US);
Guan Nan He, Beijing, CN;
Ying Xi, Beijing, CN;
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Systems and methods can use a testing framework for testing an event processing system. The testing framework operates to apply a sliding window on a stream of input events that are sent to an event processing system, wherein said event processing system processes the stream of input events in a batch mode with one or more sliding cycles, and wherein said sliding window includes one or more input events in a sliding cycle that correspond to a plurality of expected output events. Furthermore, the testing framework can receive a plurality of actual output events at an end of said sliding cycle in the batch mode from the event processing system, and uses said one or more expected output events to verify said one or more actual output events.