The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Aug. 28, 2015
Bosheng Zhang, Pleasanton, CA (US);
Matthew D. Seaberg, San Mateo, CA (US);
Daniel E. Adams, Boulder, CO (US);
Henry C. Kapteyn, Boulder, CO (US);
Margaret M. Murnane, Boulder, CO (US);
Bosheng Zhang, Pleasanton, CA (US);
Matthew D. Seaberg, San Mateo, CA (US);
Daniel E. Adams, Boulder, CO (US);
Henry C. Kapteyn, Boulder, CO (US);
Margaret M. Murnane, Boulder, CO (US);
The Regents of the University of Colorado, a body, Denver, CO (US);
Abstract
Apparatus and methods for coherent diffractive imaging with arbitrary angle of illumination incidence utilize a method of fast remapping of a detected diffraction intensity pattern from a detector pixel array (initial grid) to a uniform spatial frequency grid (final grid) chosen to allow for FFT on the remapped pattern. This is accomplished by remapping the initial grid to an intermediate grid chosen to result in a final grid that is linear in spatial frequency. The initial grid is remapped (generally by interpolation) to the intermediate grid that is calculated to correspond to the final grid. In general, the initial grid (x,y) is uniform in space, the intermediate grid ({tilde over (x)},{tilde over (y)}) is non-uniform in spatial frequency, and the final grid ({tilde over (f)},{tilde over (f)}) is uniform in spatial frequency.