The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Oct. 19, 2016
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Richard DeVaul, Menlo Park, CA (US);

Brian Adolf, San Mateo, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 21/60 (2014.01); G03B 21/602 (2014.01); H04N 9/31 (2006.01); H04N 13/04 (2006.01);
U.S. Cl.
CPC ...
G03B 21/602 (2013.01); H04N 9/3129 (2013.01); H04N 9/3152 (2013.01); H04N 9/3194 (2013.01); H04N 9/3197 (2013.01); H04N 13/0459 (2013.01);
Abstract

The present disclosure relates to methods for calibrating a light field projection system that includes a screen having convex reflective elements. One example method for calibrating a light field projection system includes scanning the plurality of convex reflective elements with light modulated according to a baseline intensity profile. The method also includes detecting a light intensity profile of the scanned light using a light detector at a first perspective. The method further includes comparing the detected light intensity profile to an expected light intensity profile and modifying operation of a control system that determines light field modulation schemes for projecting light fields to account for any differences between the detected intensity profile and the expected intensity profile. The detector may be moved to a second perspective and the previously steps of the method may be repeated from the second perspective of the light detector.


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