The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Apr. 13, 2011
Applicants:
Peter Spizig, Niederstotzingen, DE;
Wofram Ibach, Ulm, DE;
Detlef Sanchen, Blaustein, DE;
Gerhard Volswinkler, Laupheim, DE;
Olaf Hollricher, Neu-Ulm, DE;
Inventors:
Peter Spizig, Niederstotzingen, DE;
Wofram Ibach, Ulm, DE;
Detlef Sanchen, Blaustein, DE;
Gerhard Volswinkler, Laupheim, DE;
Olaf Hollricher, Neu-Ulm, DE;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01);
Abstract
The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.