The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Mar. 08, 2012
Applicants:
Denis Allard, Avignon, FR;
Alexandre Walgenwitz, Besancon, FR;
Pierre Biver, Pau, FR;
Inventors:
Assignee:
TOTAL SA, Courbevoie, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 11/00 (2006.01); G01V 99/00 (2009.01);
U.S. Cl.
CPC ...
G01V 11/002 (2013.01); G01V 11/00 (2013.01); G01V 99/00 (2013.01); G01V 2210/665 (2013.01);
Abstract
The invention relates to a method for estimating a set of variables associated with sites of an area, the method comprising the following steps: a) a set of observation data is supplied, b) a variable associated with a site of a first sub-area is estimated by krigeing, using the precision matrix of the first sub-area, c) a second adjacent sub-area is determined, d) a variable associated with a site of the second sub-area is estimated by krigeing, on the basis of the first sub-space, the second sub-space, and the precision matrix determined for the first sub-space.