The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Mar. 24, 2009
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, Palo Alto, CA (US);
Michael J. Brosnan, Fremont, CA (US);
Rong Zhou, Sunnyvale, CA (US);
Daniel B. Roitman, Menlo Park, CA (US);
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, Palo Alto, CA (US);
Michael J. Brosnan, Fremont, CA (US);
Rong Zhou, Sunnyvale, CA (US);
Daniel B. Roitman, Menlo Park, CA (US);
ALVERIX, INC., Franklin Lakes, NJ (US);
Abstract
In one aspect, an assay test strip includes a test label that specifically binds a target analyte and a control label that is free of any specific binding affinity for the target analyte and has a different optical characteristic than the test label. In another aspect, an assay test strip includes a test label that specifically binds a target analyte and at least one non-specific-binding label that is free of any specific binding affinity for the target analyte. Systems and methods of reading assay test strips also are described.