The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Jun. 03, 2014
Dh Technologies Development Pte. Ltd., Singapore, SG;
Eric Johansen, Oakland, CA (US);
DH Technologies Development Pte. Ltd., Singapore, SG;
Abstract
Systems and methods are provided for detecting host cell contaminants in a protein biotherapeutic product using sequential windowed acquisition tandem mass spectrometry. Sequential windowed acquisition is performed on a protein biotherapeutic product sample by sequentially stepping a precursor mass window across a mass range, fragmenting transmitted precursor ions of each stepped precursor mass window, and analyzing product ions produced from the fragmented transmitted precursor ions. The sequential windowed acquisition is performed without any information about contaminating proteins before data acquisition, and produces data for every product ion of every transmitted precursor ion for the mass range. One or more measured product ion spectra are received, and compared to a library of host cell proteins. One or more host cell contaminants are detected by reporting host cell proteins from the library that match the one or more measured product ion spectra.