The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Jul. 05, 2016
Applicant:

China University of Mining and Technology, Beijing, Beijing, CN;

Inventors:

Yang Ju, Beijing, CN;

Jianqiang Wang, Beijing, CN;

Ruidong Peng, Beijing, CN;

Lingtao Mao, Beijing, CN;

Hongbin Liu, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/00 (2006.01); G01N 23/04 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G06T 11/005 (2013.01); G06T 2207/10081 (2013.01); G06T 2211/428 (2013.01);
Abstract

An industrial CT scanning test system. The test system includes a test base, a multi-axis motion swivel table supported on the test base, a ray generator, an image acquisition device, and a fluid pressure loading device, and further includes a control device. The fluid pressure loading device includes at least one loading cylinder, and in case of performing a scanning experiment, the at least one loading cylinder is placed on a sample stage of the multi-axis motion swivel table together with a sample, and real-time loading of loads in different directions on the sample is performed according to test requirements.


Find Patent Forward Citations

Ju, Yang. (2018). Industrial ct scanning test system (U.S. Patent No. 9891178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9891178

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