The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Dec. 31, 2015
Samsung Electronics Co., Ltd., Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
Disclosed herein are a reactor, a test apparatus, and a test method, which measure, when a material included in a sample acts as an interfering material with respect to estimating a concentration of a target material, a concentration of the interfering material, and correct an estimated concentration of the target material based on the concentration of the interfering material, thereby improving the reliability and accuracy of the concentration of the target material. The reactor includes: a target material detecting chamber in which a first reagent that includes a first material that is activated by a target material is contained; a first material detecting chamber in which a second reagent that includes the target material is contained; an inlet hole into which a sample is injected; and a channel configured to connect the inlet hole, the target material detecting chamber, and the first material detecting chamber to each other.