The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Aug. 25, 2015
Applicant:
Edtm, Inc., Toledo, OH (US);
Inventors:
Nathan Strimpel, Milan, MI (US);
Jed Martens, Wayne, NE (US);
Mark A. Imbrock, Sylvania, OH (US);
Jeffrey A. Simpson, Wayne, NE (US);
Assignee:
EDTM, INC., Toledo, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01B 7/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0633 (2013.01); G01B 7/003 (2013.01);
Abstract
Methods and apparatuses for measuring the thickness on at least one transparent or translucent medium and detecting the presence and/or location of any conductive coating on a non-conductive medium surface are described.
Strimpel, Nathan. (2018). Apparatus and method for measuring thickness of transparent and/or translucent mediums using a reflecting signal that is normal or near normal to the mediums (U.S. Patent No. 9891041). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9891041
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile