The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Mar. 03, 2015
Applicant:

Uop Llc, Des Plaines, IL (US);

Inventors:

Gregory B. Kuzmanich, Evanston, IL (US);

Jaime G. Moscoso, Mount Prospect, IL (US);

Deng-Yang Jan, Elk Grove Village, IL (US);

Assignee:

UOP LLC, Des Plaines, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C07C 7/12 (2006.01); B01J 29/40 (2006.01); C07C 5/27 (2006.01); C07C 7/00 (2006.01); C01B 39/36 (2006.01); B01J 35/00 (2006.01); B01J 35/02 (2006.01); B01J 35/10 (2006.01);
U.S. Cl.
CPC ...
C07C 5/2737 (2013.01); B01J 29/40 (2013.01); B01J 35/002 (2013.01); B01J 35/023 (2013.01); B01J 35/026 (2013.01); B01J 35/1057 (2013.01); B01J 35/1061 (2013.01); C01B 39/36 (2013.01); C07C 5/2708 (2013.01); C07C 5/2775 (2013.01); C07C 7/005 (2013.01); C07C 7/12 (2013.01); B01J 2229/186 (2013.01); B01J 2229/42 (2013.01); C07C 2529/40 (2013.01); C07C 2529/70 (2013.01); Y02P 20/52 (2015.11);
Abstract

A process for the production of para-xylene is presented. The process includes the isomerization of C8 aromatics to para-xylene utilizing a new catalyst. The new catalyst and designated as UZM-54 is represented by the empirical composition in the as synthesized and anhydrous basis expressed by the empirical formula of:MRRAlESiOwhere M is an alkali, alkaline earth, or rare earth metal such as sodium and/or potassium, Rand Rare organoammonium cation and E is a framework element such as gallium, iron, boron, or indium. UZM-54 are characterized by unique x-ray diffraction patterns, high meso surface area, low Si/Al ratios.


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