The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

Jun. 08, 2010
Applicants:

Guoyan Zheng, Bern, CH;

Xiao Dong, Duebendorf, CH;

Lutz-peter Nolte, Huenibach, CH;

Inventors:

Guoyan Zheng, Bern, CH;

Xiao Dong, Duebendorf, CH;

Lutz-Peter Nolte, Huenibach, CH;

Assignee:

UNIVERSITY OF BERN, Bern, CH;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61F 2/46 (2006.01);
U.S. Cl.
CPC ...
A61F 2/4657 (2013.01); A61F 2/4609 (2013.01); A61F 2002/4668 (2013.01);
Abstract

An acetabular component alignment device for total hip arthroplasty comprises a calibration component allowing for aligning a main instrument axis () of the acetabular component depending on a set of two patient specific calibration parameters relating to rotational offsets of the acetabular component, whereas the device is constructed in such a way that calibration parameters may be chosen such that a second parameter of the set of calibration parameters is adjustable independently from a first parameter of the set of calibration parameters by rotating the acetabular component around the main instrument axis () of the acetabular component. A method for obtaining patient specific calibration parameters for alignment of an acetabular component in total hip arthroplasty, comprises the steps of determining patient specific morphology information relating to a geometry of the patient's pelvis; and processing the patient specific morphology information for obtaining a set of two patient specific calibration parameters relating to rotational offsets of the acetabular component. The calibration parameters are chosen such that a second parameter of the set of calibration parameters may be adjusted independently from a first parameter of the set of calibration parameters by rotating the acetabular component around a main instrument axis of the acetabular component.


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