The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Jul. 05, 2012
Hironori Ueki, Tokyo, JP;
Fumito Watanabe, Tokyo, JP;
Hironori Ueki, Tokyo, JP;
Fumito Watanabe, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In X-ray CT devices, degradation of quantitative determination ability for CT values resulting from the beam hardening (BH) effect of X-ray is prevented. X-ray absorption characteristic S obtained by simulation and a target value T thereof are saved beforehand, the simulation value S is revised by using projection data measured by maintenance measurement for obtaining basic data required for BH correction, and a BH correction coefficient is calculated by using the revised X-ray absorption characteristic S and the target value T. With a few actually measured values, BH correction accuracy can be improved, and reduction of incorrect diagnosis resulting from inhomogeneity of the CT values and improvement in the diagnostic ability based on improvement in quantitative determination ability for the CT values can be realized.