The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Jan. 08, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Tomoyuki Makihira, Tokyo, JP;
Yoshihiko Iwase, Kyoto, JP;
Makoto Sato, Tokyo, JP;
Kazuhide Miyata, Yokohama, JP;
Hiroyuki Shinbata, Tama, JP;
Ritsuya Tomita, Kawasaki, JP;
Daisuke Kibe, Chigasaki, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); G01B 9/02 (2006.01); G01J 4/00 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/0008 (2013.01); A61B 3/102 (2013.01); A61B 3/1225 (2013.01); G01B 9/02011 (2013.01); G01B 9/02091 (2013.01); G01J 4/00 (2013.01); G01B 2290/70 (2013.01);
Abstract
A control apparatus includes an irradiation unit configured to irradiate a measurement object with a measuring beam, a restriction unit configured to restrict the measuring beam from being incident on the measurement object and to reflect or scatter the measuring beam, and a polarization control unit configured to control, based on the measuring beam reflected or scattered by the restriction unit, polarization of the measuring beam.