The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Jul. 28, 2016
Applicant:

Getgo, Inc., Boston, MA (US);

Inventors:

Patrick Vicinus, Friedrichsdorf, DE;

Björn Völcker, Svedala, SE;

Assignee:

GetGo, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 9/08 (2006.01); H04R 29/00 (2006.01); H04R 3/00 (2006.01); G10L 21/0208 (2013.01); G01H 7/00 (2006.01);
U.S. Cl.
CPC ...
H04R 29/001 (2013.01); G01H 7/00 (2013.01); G10L 21/0208 (2013.01); H04M 9/082 (2013.01); H04R 3/00 (2013.01); G10L 2021/02082 (2013.01);
Abstract

One or more delay estimators are used to detect failure in a signal processing component, such as an acoustic echo canceller. A first delay estimator is used to generate i) an estimated post-processing delay between when a known audio signal was conveyed to a loudspeaker, and when a portion of the processed audio signal that includes the known audio signal was output from the signal processing component, and ii) a confidence level for the estimated post-processing delay. A failure of the signal processing component may be detected in response to the estimated post-processing delay exceeding a threshold. A second delay estimator may also be used to generate an estimated pre-processing delay and a confidence level for the estimated pre-processing delay for comparison to the estimated post-processing delay and confidence level for the estimated post-processing delay in order to provide further failure detection accuracy and specificity.


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