The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2018
Filed:
Jun. 23, 2014
Applicants:
Lingfei Meng, Redwood City, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Inventors:
Lingfei Meng, Redwood City, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/557 (2017.01);
U.S. Cl.
CPC ...
H04N 13/0282 (2013.01); G06T 7/557 (2017.01); H04N 13/0232 (2013.01); G06T 2207/10052 (2013.01);
Abstract
This invention presents an approach to first estimate a depth/disparity map using spectrally coded plenoptic camera, and then based on the disparity map the parallax between different spectral channels is rectified. Based on our new technique, we can reconstruct not only multispectral images but also a depth/disparity map. Moreover, the quality of reconstructed spectral images is significantly improved using our parallax rectification.