The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Feb. 09, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takeyuki Nagashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0866 (2013.01); H04L 41/085 (2013.01);
Abstract

A management server receives selection of a setting item to be a monitoring target from setting information that can be set for a device, extracts, as monitoring data, setting information corresponding to the selected setting item, generates a monitoring task in which a device to be a monitoring target using the monitoring data, a monitoring setting, and a monitoring schedule are set, and saves the monitoring data corresponding to the monitoring task. Meanwhile, when the setting of a device is monitored using a security policy, not monitoring data but a policy version corresponding to setting information for use in monitoring is selected to generate a monitoring task.


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Nagashima, Takeyuki. (2018). Monitoring apparatus and method (U.S. Patent No. 9887879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9887879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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