The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2018
Filed:
Feb. 04, 2016
Honeywell International Inc., Morris Plains, NJ (US);
Robert Compton, Loretto, MN (US);
Karl D. Nelson, Plymouth, MN (US);
Chad Fertig, Bloomington, MN (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
Systems and methods for eliminating multi-path errors from atomic inertial sensors are provided. In certain embodiments, a system for performing atom interferometry includes a vacuum cell containing multiple atoms and a first plurality of lasers configured to trap the atoms within the vacuum cell. The system further includes a second plurality of lasers configured to impart momentum to the atoms and direct the atoms down multiple paths, wherein a primary path in the multiple paths has a first and second component that converge at a converging point, wherein a diverging part of the primary path in which the first and second components are diverging is asymmetrical with respect to a converging part of the primary path in which the first and second components are converging, such that only the first and second components converge at the converging point wherein other paths do not converge at the converging point.