The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

May. 05, 2014
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Todd Pitts, Rio Rancho, NM (US);

Simon Hathaway, Albuquerque, NM (US);

David B. Karelitz, Albuquerque, NM (US);

John Sandusky, Albuquerque, NM (US);

Mark Richard Laine, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/32 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/3233 (2013.01); G06T 7/337 (2017.01); G06T 2207/20021 (2013.01);
Abstract

Technologies pertaining to registering a target image with a base image are described. In a general embodiment, the base image is selected from a set of images, and the target image is an image in the set of images that is to be registered to the base image. A set of disjoint regions of the target image is selected, and a transform to be applied to the target image is computed based on the optimization of a metric over the selected set of disjoint regions. The transform is applied to the target image so as to register the target image with the base image.


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