The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Dec. 03, 2015
Applicant:

Optimal Plus Ltd., Holon, IL;

Inventors:

Eran Rousseau, San Diego, CA (US);

Arie Peltz, Nes Ziona, IL;

Shaul Teplinsky, San Francisco, CA (US);

Assignee:

OPTIMAL PLUS LTD., Holon, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3172 (2013.01); G01R 31/3177 (2013.01); G01R 31/31725 (2013.01);
Abstract

A method for modifying the execution sequence of tests for testing an object on a test system. The tests include a group of tests that is a candidate for replacement. The method includes: while executing the tests according to the execution sequence and before executing the group of tests, modifying, in real time, the execution sequence including: executing a delay instead of the group of tests, wherein the delay is related to the group of tests.


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