The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2018
Filed:
Aug. 12, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Boe Optical Science and Technology Co., Ltd., Suzhou, CN;
Dengwu Long, Beijing, CN;
Jiang Yu, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BOE OPTICAL SCIENCE AND TECHNOLOGY CO., LTD., Suzhou, CN;
Abstract
The present disclosure provides a backlight source flatness detection system and a backlight source flatness detection method. The backlight source flatness detection system includes: a working table, a support column, a detection device, a processor and a display device. The working table is transparent and carries a to-be-detected backlight source. The support column supports the working table. The detection device is below the working table and detects distances between the detection device and at least two detection positions of the to-be-detected backlight source. The at least two detection positions includes at least one position of a center area and at least one position of a peripheral area. The processor is connected to the detection device and processes a detection result from the detection device so as to acquire a warpage value. The display device is connected to the processor and to display the warpage value acquired by the processor.