The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2018
Filed:
Oct. 10, 2014
Georgia Tech Research Corporation, Atlanta, GA (US);
Ifeanyi Charles Ume, Atlanta, GA (US);
Sungbum Kang, Atlanta, GA (US);
Georgia Tech Research Corporation, Atlanta, GA (US);
Abstract
Dynamic digital fringe projection (DDFP) techniques for measuring warpage. The DDFP technique generates a dynamic fringe pattern, in which a proper fringe intensity distribution is dynamically determined based on the surface reflectance of an unpainted sample in order to obtain better fringe image contrasts. The DDFP technique includes the automatic segmentation method to segment the chip package and PWB regions in an unpainted PWB assembly PWBA image. It also includes calibration methods to compensate the mismatches in coordinates and intensities between the projected and captured images.
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