The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Jul. 06, 2015
Applicant:

Recognition Robotics, Inc., Elyria, OH (US);

Inventor:

Simon Melikian, Westlake, OH (US);

Assignee:

Recognition Robotics, Inc., Elyria, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/25 (2006.01); G02B 5/10 (2006.01); B05C 5/02 (2006.01); B05C 11/10 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); B05C 5/0216 (2013.01); B05C 11/1005 (2013.01); G02B 5/10 (2013.01);
Abstract

A measurement system includes a cylindrical mirror, a light source, a photosensitive array, and a processor. The light source is configured and positioned with respect to the cylindrical mirror such that light from the light source is reflected from the cylindrical mirror as a circular arc on an object surface. The photosensitive array is positioned with respect to the cylindrical mirror to detect the circular arc on the object surface. The processor is in communication with the photosensitive array and is configured to detect a break in the circular arc and to measure a substance applied to the object surface based on an image detected by the photosensitive array.


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