The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2018

Filed:

Jun. 25, 2013
Applicant:

Life Technologies Corporation, Carlsbad, CA (US);

Inventors:

Scott Conradson, Carlsbad, CA (US);

David Dinauer, Fox Point, WI (US);

Bin Zhao, Brown Deer, WI (US);

Dmitriy Gremyachinskiy, San Francisco, CA (US);

Jason Myers, Golden, CO (US);

Jeffrey Rossio, Frederick, MD (US);

Victoria Singer, Eugene, OR (US);

Kristina Giorda, Carlsbad, CA (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 33/543 (2006.01); G01N 33/569 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6876 (2013.01); G01N 33/543 (2013.01); G01N 33/54326 (2013.01); G01N 33/54373 (2013.01); G01N 33/56977 (2013.01); G01N 33/6854 (2013.01); G01N 2333/4703 (2013.01);
Abstract

Accordingly, in some embodiments methods for detecting an analyte or analytes in one or more sample(s) are provided. The methods encompass providing a solid support with an addressable marker and an associated ligand, contacting the solid substrate to a sample, thereby forming a contacted solid support, associating the contacted solid support with a FET array and detecting the electrical properties of the FET array and thereby detecting an analyte or analytes in one or more samples. In other embodiments, the sample encompasses a second addressable marker.


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