The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jun. 16, 2011
Applicants:

Yoshihito Sato, Tokyo, JP;

Tsutomu Yamada, Tokyo, JP;

Hiromichi Endo, Tokyo, JP;

Inventors:

Yoshihito Sato, Tokyo, JP;

Tsutomu Yamada, Tokyo, JP;

Hiromichi Endo, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06G 7/62 (2006.01); H04W 16/18 (2009.01); H04B 17/318 (2015.01); H04B 17/391 (2015.01); H04B 17/20 (2015.01); H04W 16/20 (2009.01); H04B 17/23 (2015.01); H04B 17/27 (2015.01);
U.S. Cl.
CPC ...
H04W 16/18 (2013.01); H04B 17/20 (2015.01); H04B 17/318 (2015.01); H04B 17/391 (2015.01); H04B 17/23 (2015.01); H04B 17/27 (2015.01); H04W 16/20 (2013.01);
Abstract

A method for measuring a radio wave propagation environment includes installing radio signal transmission and reception apparatuses where a radio network system is to be constructed and obtaining an electromagnetic wave measured value of a signal between transmission and reception apparatuses; estimating an electromagnetic wave propagation state of the signal using an electrical property and information on a three-dimensional structure at the site to obtain an electromagnetic wave estimated value; making a comparison between measured and estimated values for each time of day to determine when errors between measured and estimated values exceed a reference value; obtaining an electromagnetic path between transmission and reception apparatuses; and modifying structure information in the wave path to re-obtain the estimated value; and comparing the measured re-obtained estimated value to modify the three-dimensional structure information so that the error value becomes smaller.


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