The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Feb. 25, 2016
Applicant:

National Applied Research Laboratories, Taipei, TW;

Inventors:

Chi-Hung Huang, Taipei, TW;

Yung-Hsiang Chen, Taipei, TW;

Wei-Chung Wang, Taipei, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/247 (2006.01); H04N 13/02 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
H04N 5/247 (2013.01); G06K 9/00771 (2013.01); G06K 9/52 (2013.01); G06T 7/0018 (2013.01); H04N 13/0242 (2013.01); H04N 13/0246 (2013.01);
Abstract

The present invention discloses a method of determining a whole-scene image by using multiple image-capturing devices, and the method has two main features including non-contact formation digital image method and the parallax elimination process for captured images. The former feature uses a concyclic fitting calculation to easily determine the locations and orientations of the image-capturing devices, so as to achieve the objective of assisting in capturing the whole-scene image. The latter feature can effectively improve the image quality, so as to effectively solve the problems in conventional technology.


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