The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jun. 26, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Gary Taylor, Dublin, IE;

Brian Dennehy, Dublin, IE;

Sebastien Alexandre Roland Rodriguez, Dublin, IE;

Julio Delgado Mangas, Dublin, IE;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); H04L 12/911 (2013.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 47/783 (2013.01); H04L 41/5009 (2013.01); H04L 41/5061 (2013.01);
Abstract

A web server computer system receives a plurality of measurements for a metric from one or more computing resources associated with the web server computer system. Each measurement includes metadata for the measurement, which specifies attributes of the measurement. The web server computer system determines, for each measurement and based at least in part on the metadata, a fully qualified metric identifier for the measurement. The web server computer system uses the fully qualified metric identifier to partition the plurality of measurements into various partitions. Once completed, the web server computer system transmits a request to one or more aggregator sub-systems of a computing resource monitoring service to store the plurality of measurements.


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