The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Dec. 21, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Daniel Scott Groninger, Port Royal, PA (US);

Robert Carroll Ward, State College, OH (US);

Francois Xavier de Fromont, State College, PA (US);

Chad Martin Shaffer, State College, PA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G09B 5/00 (2006.01); G01N 29/22 (2006.01); G09B 19/24 (2006.01);
U.S. Cl.
CPC ...
G09B 5/00 (2013.01); G01N 29/04 (2013.01); G01N 29/22 (2013.01); G09B 19/24 (2013.01);
Abstract

A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.


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