The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jun. 16, 2016
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Takashi Kono, Tachikawa, JP;

Yamato Kanda, Hino, JP;

Makoto Kitamura, Hachioji, JP;

Toshiya Kamiyama, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/64 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 7/64 (2017.01); G06T 2207/10068 (2013.01); G06T 2207/30028 (2013.01);
Abstract

An image processing apparatus includes: a region-of-interest setting unit configured to set a region of interest in an image; a linear convex region extracting unit configured to extract, from the region of interest, a linear region having a predetermined number or more of continuously-arranged pixels whose pixel values are higher than pixel values of neighboring pixels; an intra-region curvature feature data computing unit configured to compute curvature feature data based on curvatures of one or more arcs along the linear region; and an abnormality determining unit configured to determine whether there is an abnormal portion in the region of interest, based on a distribution of the curvature feature data.


Find Patent Forward Citations

Loading…