The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Jan. 05, 2015
Olympus Corporation, Tokyo, JP;
Naoyuki Miyashita, Tokorozawa, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An image analysis unit of an image processing apparatus acquires a distribution condition of feature points in an entire input image and in each of a plurality of small regions in the input image. A target point number setting unit sets a target point number for each small region based on the distribution condition of feature points in the entire input image. An expected point number setting unit sets an expected point number for each small region based on the distribution condition of feature points in the small region. A comparison unit compares the target point number and the expected point number. A sensitivity setting unit sets detection sensitivity based on the comparison result. A feature point detection unit performs feature point detection according to the detection sensitivity.