The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Mar. 31, 2016
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Ramachandra Budihal, Bangalore, IN;

Sujatha Jagannath, Bangalore, IN;

Sendil Kumar Jaya Kumar, Bangalore, IN;

Assignee:

WIPRO LIMITED, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00463 (2013.01); G06K 9/3233 (2013.01); G06T 7/0081 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30176 (2013.01);
Abstract

In one embodiment, an image processing device for detecting tampering in a document image is disclosed. The image processing device comprises a processor and a memory communicatively coupled to the processor. The memory stores processor instructions, which, on execution, causes the processor to determine an image quality of the document image by analyzing one or more quality features extracted from the document image. The processor is caused to pre-process the document image based on a pre-defined ontology of documents when the image quality is above a pre-defined quality threshold. Further, the processor is caused to segment the pre-processed document image into one or more region of interests based on the pre-defined ontology of documents and detect tampering in a region of interest in the document image by processing each region of interest of the one or more region of interests to detect tampering in the document image.


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