The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Jan. 04, 2013
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Hae-kyung Jung, Seoul, KR;
Hee-chul Yoon, Seoul, KR;
Hyun-taek Lee, Seoul, KR;
Yong-je Kim, Yongin-si, KR;
Jae-hyun Kim, Seoul, KR;
Myung-jin Eom, Seoul, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/26 (2011.01); A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
G06F 19/26 (2013.01); A61B 8/0866 (2013.01); A61B 8/5223 (2013.01); A61B 8/085 (2013.01); A61B 8/0858 (2013.01); A61B 8/469 (2013.01);
Abstract
A method for measuring biometrics of an object includes receiving an image of an object, modeling the object to identify a portion of the object, and measuring biometrics of the object based on a modeling result the object.