The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Oct. 31, 2012
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takayuki Machida, Tokyo, JP;

Takaki Kuroda, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30507 (2013.01); G06F 11/0709 (2013.01); G06F 11/079 (2013.01); G06F 11/3055 (2013.01); G06F 17/30088 (2013.01); G06F 11/3072 (2013.01); G06F 2201/86 (2013.01);
Abstract

A monitor system transmits a request requesting event occurrence information to multiple node apparatuses, detects occurrence of an event on the basis of event occurrence information included in a response, calculates an index value of each of conclusions of multiple rules indicating corresponding relationship between one or more condition events and a conclusion, and generates, at a predetermined time point, a snapshot indicating an index value at that time point. When the monitor system receives a first response in reply to a first request, the monitor system updates the index value indicated by the snapshot generated in a period from a transmission date/time of the first request to a reception date/time of the first response, on the basis of the first response.


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