The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jan. 09, 2015
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

YoungHwan Namkoong, Seoul, KR;

DaWoon Kim, Seoul, KR;

JeongHoon Hong, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/00 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30371 (2013.01); G06F 17/30997 (2013.01); G11B 20/18 (2013.01);
Abstract

Disclosed are a system and method for processing data. The system for processing data according to an embodiment of the present disclosure includes a determiner configured to receive one or more sets of input data and a set of metadata about a structure of each of the sets of input data and to determine whether the input data is normal data or abnormal data based on the metadata; a first storage configured to store the normal data; a second storage configured to store the abnormal data; and a data processor configured to correct the abnormal data stored in the second storage such that the abnormal data has the same structure as the normal data and store the corrected abnormal data in the first storage.


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