The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jun. 26, 2015
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Gary Taylor, Dublin, IE;

Brian Dennehy, Dublin, IE;

Sebastien Alexandre Roland Rodriguez, Dublin, IE;

Julio Delgado Mangas, Dublin, IE;

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 9/50 (2006.01);
U.S. Cl.
CPC ...
G06F 9/505 (2013.01); G06F 9/5077 (2013.01); G06F 9/5083 (2013.01);
Abstract

A computing resource monitoring service receives a plurality of measurements for a metric associated with an auto-scale group. Each measurement is associated with metadata for the measurement, which specifies attributes for the measurement. The computing resource monitoring service determines, for each measurement and based at least in part on the metadata, a fully qualified metric identifier for the measurement. The service partitions the plurality of measurements into a plurality of logical partitions associated with one or more in-memory datastores. The service transmits the measurements from the plurality of logical partitions to the one or more datastores for storage of the measurements. These measurements are provided to one or more computing resource managers for the auto-scale group to enable automatic scaling of computing resources of the group based at least in part on the measurements.


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