The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Feb. 12, 2016
Google Inc., Mountain View, CA (US);
Robert Hagmann, Palo Alto, CA (US);
Xiao Zhang, San Jose, CA (US);
Eric S. Tune, Saratoga, CA (US);
Vrijendra Gokhale, Cupertino, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
Among other disclosed subject matter, a method includes receiving metric data associated with an execution of each of a plurality of task instances. The plurality of task instances include task instances associated with a task and the metric data for each task instance relating to execution performance of the task instance. The method includes for each task instance determining a deviation of the metric data associated with the task instance relative to an overall deviation of the metric data for the plurality of task instances of the task during each of a plurality of intervals and combining deviation measurements for the task instance that exceed a threshold deviation to obtain a combined deviation value. Each deviation measurement corresponds to the deviation of the metric data for one of the plurality of intervals. The method includes ranking the combined deviation values associated with at least a subset of the task instances.