The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Sep. 24, 2015
Apple Inc., Cupertino, CA (US);
Manu Agarwal, Redwood City, CA (US);
Jason C. Hu, Palo Alto, CA (US);
Dhaval Patel, San Jose, CA (US);
Shahrooz Shahparnia, Monte Sereno, CA (US);
Sumant Ranganathan, Saratoga, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Noise in sensor panel measurements can be reduced using a common pixel correction algorithm. Noise can be introduced into touch or force sensor panel measurements, for example, by circuitry of a transmit (Tx) section or a receive (Rx) section coupled to one or more sensing nodes of a sensor panel. For example, a digital-to-analog converter in the transmit section or an analog-to-digital converter in the receive section can introduce low-frequency correlated noise. Additionally, transmit and receive sections can introduce uncorrelated noise into the system. Reference nodes, coupled between Tx and Rx sections, can sense correlated and uncorrelated noise from the Tx and Rx sections. The noise measured at reference nodes can be subtract from signals measured at other sensing nodes coupled to the same Rx channel. The measurement at the reference node can be scaled using a scaling parameter to account for differences between reference nodes and sensing nodes.