The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Sep. 09, 2016
Applicant:
Photonicsys Ltd., Wahat Alsalam, IL;
Inventors:
Avner Safrani, D.N. Misgav, IL;
Michael Ney, Be'er Sheva, IL;
Ibrahim Abdulhalim, Wahat-Alsalam-Neve Shalom, IL;
Assignee:
Photonicsys Ltd., Wahat Alsalam, IL;
Primary Examiner:
Int. Cl.
CPC ...
G07B 9/02 (2006.01); G02B 21/00 (2006.01); G02B 27/28 (2006.01); G02B 21/36 (2006.01); G02B 21/22 (2006.01); G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0056 (2013.01); G02B 21/0032 (2013.01); G02B 21/0064 (2013.01); G02B 21/0084 (2013.01); G02B 21/0092 (2013.01); G02B 21/22 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); G02B 27/286 (2013.01);
Abstract
A system microscopy system and method that enable obtaining high resolution 3D images in a single shot are presented. The system is an ultra-high speed, real time multi wavelength phase shift interference microscopy system that uses three synchronized color CCD cameras. Each CCD is equipped with a precision achromatic phase mask which in turn allows obtaining π/2 phase shifted signals in three different wavelengths simultaneously.