The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jul. 23, 2014
Applicant:

Rapiscan Systems, Inc., Torrance, CA (US);

Inventors:

Andreas Pfander, Torrance, CA (US);

Ronald James Hughes, Garden Grove, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01); G01N 23/04 (2013.01); G01V 5/0008 (2013.01);
Abstract

The present specification describes methods and systems for inspecting objects by means of penetrating radiation where objects are conveyed through the penetrating radiation and subsequent images of objects are reviewed by an operator. Specifically, the present specification describes a system that decouples the synchronization between cessation of image generation on the display and image acquisition through conveyance of the article. Further, the present specification discloses methods for compensating for image acquisition inefficiencies involving article separation by the queuing conveyor and the post-stop back belt process, resulting in throughput enhancement.


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