The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Feb. 08, 2011
Applicants:

Evgeny Landa, Pau, FR;

Reda Baina, Pau, FR;

Inventors:

Evgeny Landa, Pau, FR;

Reda Baina, Pau, FR;

Assignee:

TOTAL SA, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/30 (2013.01);
Abstract

Post-migration common image gathers (CIGs) are generated in a dip angle domain from measured seismic data. From a CIG, a hybrid Radon model is determined, including a reflection model related to concave features in the CIG and a diffraction model related to linear features in the CIG. The reflection model is transformed with a reflection Radon operator applied along inversion trajectories restricted around apices of the concave features to obtain reflection data. The diffraction model is transformed with a diffraction Radon operator to obtain diffraction data. The reflection and diffraction data at different horizontal positions can then be combined and summed to generate a migrated image of the subsurface.


Find Patent Forward Citations

Loading…