The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Dec. 25, 2013
Applicant:

Raycan Technology Co., Ltd. (Su Zhou), Jiangsu, CN;

Inventors:

Zhenzhou Deng, Jiangsu, CN;

Qingguo Xie, Jiangsu, CN;

Assignee:

RAYCAN TECHNOLOGY CO., LTD. (SU ZHOU), Suzhou New District, Suzhou, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2985 (2013.01);
Abstract

A time label combination method, comprising the steps: collecting data acquisition system digital measurement values and establishing a database for the measured values; identifying atomic time label quantities and shape fluctuation statistics; estimating a covariance matrix of each atomic time label; according to the least squares criterion, giving the time label combination. Also provided is a time label combination system, comprising a low-dose pre-acquisition data module, a digital identification module, a quantitative variance calculation module, and a time label combination parameter calculation module. By means of using the described time label combination method and system, system and resolution is effective increased, and the invention is particularly suitable for nuclear instrument time acquisition.


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