The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2018
Filed:
Feb. 03, 2017
Mettler-toledo Gmbh, Greifensee, CH;
Einar Sorensen, Oslo, NO;
Espen Rutger, Oslo, NO;
Kjell Krakenes, Oslo, NO;
Eivind Kvedalen, Oslo, NO;
Mettler-Toledo GmbH, Greifensee, CH;
Abstract
The dimensions of an object are measured as it is transported by a forklift within an area of measurement. A first scanner is on a first side of the area of measurement; a second scanner is on an opposite second side and across the first scanner. The first and second scanners provide a dual-head scanner arrangement to capture dimensions of the object. A third scanner is on the first side of the area of measurement, parallel to the first scanner. The first and third scanners are configured to capture speed and direction of the object. Each scanner has a processor to operate it. The first and second scanners are synchronized, and operation of the first and third scanners is correlated. Placement of the first and second scanners establishes a width of the area of measurement and the first and third scanners establish a length thereof.