The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jul. 31, 2015
Applicant:

Avago Technologies General Ip (Singapore) Pte. Ltd., Singapore, SG;

Inventors:

Milos Davidovic, Vienna, AT;

Wolfgang Gaberl, Vienna, AT;

Gunther Steinle, Regensburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/486 (2006.01); G01J 1/42 (2006.01); G01S 17/08 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01J 1/4204 (2013.01); G01S 7/497 (2013.01); G01S 17/08 (2013.01);
Abstract

An optical measurement system includes a photodetector coupled in series with a field effect transistor (FET) that is a part of a sample and hold circuit. When the sample and hold circuit is in a sampling mode of operation, a voltage bias is applied to the FET and the photodetector is exposed to ambient light, thus resulting in a first current flow through the photodetector. One of several components can be selected in the sample and hold circuit for obtaining a desired time constant. When the sample and hold circuit is subsequently placed in a hold mode of operation, a second current flows through the photodetector due to exposing of the photodetector to a combination of ambient light and light associated with an optical measurement. A portion of the second current that is attributable to the light associated with the optical measurement is used for executing the optical measurement.


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