The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Jun. 20, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Jan Ole Blumhagen, Erlangen, DE;

Stephan Kannengieβer, Wuppertal, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/565 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/565 (2013.01); G01R 33/56391 (2013.01); G01R 33/56383 (2013.01); G01R 33/56563 (2013.01); G01R 33/56572 (2013.01);
Abstract

Various embodiments relate to a method for determining distortion-reduced magnetic resonance data in a subarea of a magnetic resonance system located along a radial direction of the magnetic resonance system at the edge of a field of view of the magnetic resonance system. The method includes positioning the object to be examined at a first and a second position along an axial direction of the magnetic resonance system and acquiring first magnetic resonance data in the subarea at the first position and acquiring second magnetic resonance data in the same subarea at the second position. The method also includes determining distortion-reduced magnetic resonance data based on the first and second magnetic resonance data.


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