The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2018

Filed:

Oct. 17, 2014
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Su-hyung Park, Seoul, KR;

Yeol-min Seong, Seoul, KR;

Sang-cheon Choi, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/561 (2006.01); G01R 33/385 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5612 (2013.01); G01R 33/3852 (2013.01); G01R 33/4818 (2013.01); G01R 33/5611 (2013.01);
Abstract

A magnetic resonance imaging (MRI) apparatus and method are provided. The MRI apparatus includes a first interpolator configured to generate a plurality of first interpolation data by performing calibration on a plurality of undersampled K-space data obtained from a plurality of channel coils in a radio frequency (RF) multi-coil, respectively, and a second interpolator configured to generate a plurality of second interpolation data by performing calibration on a plurality of filtered data obtained by filtering the first interpolation data using a plurality of high-pass filters.


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